Ushbu ish iqtibos qilgan ishlar

12 ta ish

Ish: The Effect of the Fin Shape and Thickness of the Buried Oxide on the DIBL Effect in an SOI FinFET

1. Multigate transistors as the future of classical metal–oxide–semiconductor field-effect transistors

   Isabelle Ferain, Cynthia A. Colinge, Jean-Pierre Colinge

   Maqola201112 iqtibos

   ABIABI:AkademIndex/2026.other.386765

2. Short-channel effects in SOI MOSFETs

   S. Veeraraghavan, J.G. Fossum

   Maqola19897 iqtibos

   ABIABI:AkademIndex/2026.other.390677

3. Implementation of the Density Gradient Quantum Corrections for 3-D Simulations of Multigate Nanoscaled Transistors

   Antonio J. García‐Loureiro, Natalia Seoane, M. Aldegunde +4

   Maqola20117 iqtibos

   ABIABI:AkademIndex/2026.other.397911

4. Quantum corrections in the simulation of decanano MOSFETs

   Asen Asenov, A. R. Brown, J.R. Watling

   Maqola20034 iqtibos

   ABIABI:AkademIndex/2026.other.532704

5. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.532701

6. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.532702

7. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.532703

8. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.532705

9. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.532706

10. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.532707

11. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.532708

12. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.532709