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Ish: Self heating and DIBL effects in 2D MoS2 based MOSFET with different gate oxide and back oxide materials
Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films
Matthew A. Panzer, Michael Shandalov, Jeremy Rowlette +4
Maqola20094 iqtibosABIMOSFET scaling: Impact of two-dimensional channel materials
R. Granzner, Zhansong Geng, W. Kinberger +1
Maqola20164 iqtibosABI