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Ish: Analysis of the process of Emf and current generation in Si/Si film structures obtained by vacuum deposition
The role of metrological supply in enterprises
P. M. Matyakubova, G‘.G‘. Boboev, M. M. Mahmudjonov +1
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Б. Е. Умирзаков, S. J. Nimatov, Kh. Kh. Boltaev
MaqolaSilicon and Solar Cell TechnologiesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20148 iqtibosABI