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Analysis of the structure and properties of heterostructured nanofilms prepared by epitaxy and ion implantation methods

Б. Е. УмирзаковInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, UzbekistanД. А. ТашмухамедоваInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, UzbekistanМ. К. РузибаеваInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, UzbekistanA. K. TashatovInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, UzbekistanS. B. DonaevInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, UzbekistanB. B. MavlyanovInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Akademgorodok, Tashkent, 100125, Uzbekistan
Technical Physicsjournal2013en
ABI

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The energy band diagram of multilayer nanofilm systems formed on the basis of Si, GaAs, and CaF2 is constructed. The optimal regimes of obtaining homogeneous films of a complex composition are determined.

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