← Ishga qaytish
Ushbu ish iqtibos qilgan ishlar
11 ta ish
Ish: The Effect of Thermal Annealing on the Electrophysical Properties of Samples n-Si<Ni,Сu>
Dopant microassociation mechanisms in Si〈Mn〉 and Si〈Ni〉
С. З. Зайнабидинов, K. N. Musaev, N. A. Turgunov +1
Maqola20126 iqtibosABI