← Ishga qaytish
Ushbu ishga iqtibos qilgan ishlar
2 ta ish
Ish: Study of the Distribution Profile for Nickel Implanted in Silicon and the Effect of Annealing on the Structure
Defect Formation and Displacement of Atoms on the Surface of a LiF Crystal under Bombardment with Low-Energy Cesium Ions
Utkirjon Sharopov, O. A. Abdulkhaev, Б. Э. Эгамбердиев +11
MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20242 iqtibosABI