Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Investigation of the defect manganese silicide MnnSi2n−m

1. Electron microscopy characterization of higher manganese silicide film structure on silicon

   Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

   MaqolaSemiconductor materials and interfacesNanotechnologies in Russia20167 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.079735

2. Structure of thermoelectric films of higher manganese silicide on silicon according to electron microscopy data

   Andrey Orekhov, T. S. Kamilov, B.V. Ibragimova +2

   MaqolaSemiconductor materials and interfacesSemiconductors20175 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.199258