Relationship of electrical resistance of polycrystalline tin films to structural characteristics

Change of electrical resistance with temperature is studied in tin films of various thicknesses, produced by condensation on a substrate at helium temperature and subjected to heating up to various temperatures (between helium and room). A parallel electron diffraction study of crystallite size during heating is performed. Using the Mayadas-Shatzkes theory and approximate linearized expressions obtained therefrom for the temperature coefficient of polycrystalline film resistance, the values of the specularity coefficient for reflection of electrons from external surfaces and the reflection coefficient from intercrystallite boundaries’ together with their changes due to recrystallization are determined. The temperature behavior of these characteristics is also determined.

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