Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Oxide thickness dependence of electron-induced surface states in MOS structures

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   ABIABI:AkademIndex/openalex/2004.article.000159

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   П. Б. Парчинский

   MaqolaIon-surface interactions and analysisRussian Microelectronics20050 iqtibos

   ABIABI:AkademIndex/openalex/2005.article.000246