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1. Investigation of profiles of the distribution of ion-implanted Mn atoms using the rutherford back scattering method and the influence of thermal annealing on them

   Б. Э. Эгамбердиев, Б.Ч. Холлиев, A. S. Mallaev

   MaqolaIon-surface interactions and analysisSurface Engineering and Applied Electrochemistry20070 iqtibos

   ABIABI:AkademIndex/openalex/2007.article.000375