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Work: New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

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  6. Negative-U Properties for Point Defects in Silicon

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  7. Transferable tight-binding models for silicon

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  8. Generating Transferable Tight-Binding Parameters: Application to Silicon

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  9. Microscopic Theory of Atomic Diffusion Mechanisms in Silicon

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  13. Computer Modelling of Electronic and Atomic Processes in Solids

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  14. Ion-solid interactions for materials modification and processing

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  15. Theory of Enhanced Migration of Interstitial Aluminum in Silicon

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  16. DEFECT METASTABILITY IN HYDROGEN PASSIVATED POLYCRYSTALLINE SILICON

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  17. DEFECTS IN AMORPHOUS Si:H — THE REHYBRIDIZED TWO-SITE (RTS) MODEL

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  18. Role of hydrogen complexes in the metastability of hydrogenated amorphous silicon

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