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Works cited by this work

14 works

Work: Cluster projectile ions used for the SIMS analysis of silicon

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 citations
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics Letters200312 citations
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  4. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    ArticleIon-surface interactions and analysisVacuum20009 citations
    ABI

  5. Comparative study of kinetic energy spectra and mass distributions of Ta+ ions sputtered from tantalum by atomic and molecular ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +1

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19988 citations
    ABI

  6. Cluster impacts at keV and MeV energies: Secondary emission phenomena

    Y. Le Beyec

    Article19987 citations
    ABI

  7. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

    D. Stapel, O. Brox, A. Benninghoven

    Article19995 citations
    ABI

  8. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

    Alain Brunelle, S. Della‐Negra, J. Depauw +5

    Article20015 citations
    ABI

  9. Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

    D. Stapel, A. Benninghoven

    Article20015 citations
    ABI

  10. Sputtering of large size clusters from solids bombarded by high energy cluster ions and fullerenes

    K. Baudin, Alain Brunelle, S. Della‐Negra +6

    Article19964 citations
    ABI

  11. Surface Mass Spectrometry at the Submicrometer Scale

    С. В. Верхотуров, E. A. Schweikert, Nabil Rizkalla

    Article20022 citations
    ABI

  12. Teoriya raspyleniya

    G. Falcone

    Article19922 citations
    ABI

  13. Untitled

    Other1 citations
    ABI

  14. Untitled

    Other1 citations
    ABI