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Works cited by this work

14 works

Work: On the unimolecular decay and mechanism of formation of Si+ n cluster ions

  1. Sputtering by Particle Bombardment III

    R. Behrisch, K. Wittmaack, Wittmaack, Klaus +1

    Book199118 citations
    ABI

  2. Ion microprobe for studying cluster ion decay reactions

    A. D. Bekkerman, Н. Х. Джемилев, V. M. Rotstein

    Article199016 citations
    ABI

  3. Unimolecular reactions

    P. G. Ashmore, Peter Robinson

    Chapter197515 citations
    ABI

  4. Fragmentation of sputtered Si n O+ m clusters: Release kinetic and dissociation energies

    Н. Х. Джемилев, С. Ф. Коваленко, L.F. Lifanova +2

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics200811 citations
    ABI

  5. Shock wave mechanism for cluster emission and organic molecule desorption under heavy ion bombardment

    I.S. Bitensky, E.S. Parilis

    Article19878 citations
    ABI

  6. Mechanism for the formation of molecular clusters under ion sputtering

    Н. Х. Джемилев

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20127 citations
    ABI

  7. On the energy distribution of sputtered dimers

    G. P. Können, A. Tip, A.E. De Vries

    Article19745 citations
    ABI

  8. Decay rate constants of sputtered vanadium oxide clusters

    С. Е. Максимов, Н. Х. Джемилев, С. Ф. Коваленко +2

    ArticleTransition Metal Oxide NanomaterialsBulletin of the Russian Academy of Sciences Physics20144 citations
    ABI

  9. Energy spectrum of a 2D Dirac electron in the presence of a constant magnetic field

    Vı́ctor M. Villalba, A. Rincon Maggiolo

    Article20014 citations
    ABI

  10. Fragmentation processes of vanadium and niobium oxide clusters sputtered by ion bombardment

    Н. Х. Джемилев, С. Ф. Коваленко, С. Е. Максимов +2

    ArticleCatalytic Processes in Materials ScienceJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20143 citations
    ABI

  11. Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

    C.-E. Richter, Michael Trapp

    Article19813 citations
    ABI

  12. Untitled

    Other1 citations
    ABI

  13. Untitled

    Other1 citations
    ABI

  14. Untitled

    Other1 citations
    ABI