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Works cited by this work

12 works

Work: Thermally Stimulated Transformation of Oxygen Atoms Between Phase States in a Silicon Single Crystal

  1. Method to Measure the Precipitated and Total Oxygen Concentration in Silicon

    L. Jastrzȩbski, P. J. Zanzucchi, D. Thébault +1

    Article19823 citations
    ABI

  2. Oxygen Segregation and Microscopic Inhomogeneity in Czochralski Silicon

    Wen Lin, Michael Stavola

    Article19853 citations
    ABI

  3. Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline

    F01 Committee

    Other20003 citations
    ABI

  4. Фазовый переход alpha-beta в примесной фазе монокристалла кремния SiO-=SUB=-2-=/SUB=-

    М.У. Каланов, A. V. Khugaev

    ArticleX-ray Diffraction in CrystallographyПисьма в журнал технической физики20212 citations
    ABI

  5. Czochralski growth of silicon

    W. Zulehner

    Article19832 citations
    ABI

  6. Oxygen-related thermal donors in silicon: A new structural and kinetic model

    A. Ourmazd, W. Schröter, A. Bourret

    Article19842 citations
    ABI

  7. Defects in silicon

    R.C. Newman

    Article19822 citations
    ABI

  8. Carbon in silicon: Properties and impact on devices

    Bernd O. Kolbesen, A. Mühlbauer

    Article19822 citations
    ABI

  9. Oxygen precipitation and microdefects in Czochralski-grown silicon crystals

    Kiyoshi Yasutake, M. Umeno, H. Kawabe

    Article19842 citations
    ABI

  10. Untitled

    Other1 citations
    ABI

  11. Untitled

    Other1 citations
    ABI

  12. Untitled

    Other1 citations
    ABI