Skip to main content
AkademIndex

Products

For developers

AkademBaseOpen API for the ecosystem
← Back to work

Works cited by this work

11 works

Work: The effect of atmospheric oxide thermodesorption on negative-ion atomic and cluster sputtering of silicon single crystal by cesium ions

  1. Diffusion and Electroluminescence Studies of Low Temperature Diffusion of Boron in 3C-SiC

    I. G. Atabaev, C. C. Tin, Б.Г. Атабаев +12

    Article20088 citations
    ABI

  2. Neutral and negative ion cluster emission during sputtering

    M.K. Abdullaeva, Б.Г. Атабаев, R. Dzabbarganov

    Article19915 citations
    ABI

  3. Энергетический порог атомарного и кластерного распыления некоторых элементов при бомбардировке ионами Cs, Rb, Na

    Р. Джаббарганов, Б. Г. Атабаев, З. А. Исаханов +1

    Article20193 citations
    ABI

  4. Энергетическая и температурная зависимость вторичной ионной эмиссии кластеров GaN/SiC при бомбардировке ионами цезия

    Б.Г. Атабаев, Р. Джаббарганов, М. Х. Ахмаджонова +1

    Article20213 citations
    ABI

  5. The reaction of atomic oxygen with Si(100) and Si(111)

    J. R. Engstrom, D. J. Bonser, Mark J. Nelson +1

    Article19912 citations
    ABI

  6. Thermal desorption of ultrathin silicon oxide layers on Si(111)

    Azam Iraji zad, Nima Taghavinia, Mohammad Mahdi Ahadian +1

    Article20002 citations
    ABI

  7. Void growth during thermal decomposition of silicon oxide layers studied by low-energy electron microscopy

    Hiroki Hibino, Masashi Uematsu, Yoshio Watanabe

    Article20062 citations
    ABI

  8. The mesoscopic and microscopic structural consequences from decomposition and desorption of ultrathin oxide layers on Si(100) studied by scanning tunneling microscopy

    Kevin E. Johnson, Perng-Horng Wu, Michael Sander +1

    Article19932 citations
    ABI

  9. Nanoscale<i>in situ</i>investigation of ultrathin silicon oxide thermal decomposition by high temperature scanning tunneling microscopy

    Kun Xue, Jianbin Xu, H.P. Ho

    Article20072 citations
    ABI

  10. Direct measurement of reaction kinetics for the decomposition of ultrathin oxide on Si(001) using scanning tunneling microscopy

    Kevin E. Johnson, Thomas Engel

    Article19922 citations
    ABI

  11. Chemical and kinetic insights into the Thermal Decomposition of an Oxide Layer on Si(111) from Millisecond Photoelectron Spectroscopy

    Jean‐Jacques Gallet, Mathieu G. Silly, Mario El Kazzi +3

    Article20172 citations
    ABI