Skip to main content
AkademIndex

Products

For developers

AkademBasesoonOpen API for the ecosystem
Latin
English
Chapter

The Complexity of Testing Cryptographic Devices on Input Faults

Alisher IkramovNational University of Uzbekistan, Tashkent, UzbekistanGayrat JuraevNational University of Uzbekistan, Tashkent, Uzbekistan
Lecture notes in computer sciencebook series2021en
ABI

Abstract

No abstract available.

Topics

VLSI and Analog Circuit TestingMathematical Control Systems and Analysis

Identifiers

DOI
10.1007/978-3-030-92708-0_12

Citations and references

Cited by 52 references
Metrics — AkademScholar · Coming soon