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7 works

Work: Cluster impacts at keV and MeV energies: Secondary emission phenomena

  1. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  2. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

    Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 citations
    ABI

  3. Model for large cluster emission in ion sputtering of metals applied to atomic and polyatomic ion bombardments

    S.F. Belykh, V. I. Matveev, I. V. Veryovkin +2

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19992 citations
    ABI

  4. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 citations
    ABI

  5. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20121 citations
    ABI

  6. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics20130 citations
    ABI

  7. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

    Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20240 citations
    ABI