S. Ruvimov

Работ: 2

1. Distribution of Defects in InAs<sub>1-x-y</sub>Sb<sub>x</sub>P<sub>y</sub>-InAs DHs

   T. S. Argunova, R. N. Kyutt, B. A. Matveev +3

   СтатьяAdvanced Semiconductor Detectors and MaterialsDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena1991Цитирований: 0

   ABIABI:AkademIndex/openalex/1991.article.000041

2. New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures

   R. N. Kyutt, J. Heydenreich, S. Ruvimov +5

   СтатьяAdvanced ceramic materials synthesisDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena1993Цитирований: 0

   ABIABI:AkademIndex/openalex/1993.article.000143