Jung Ho Je

Работ: 2

Pohang University of Science and Technology

1. X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

   T. S. Argunova, M. Yu. Gutkin, Jung Ho Je +5

   СтатьяSilicon Carbide Semiconductor TechnologiesMaterials science forum2004Цитирований: 0

   ABIABI:AkademIndex/openalex/2004.article.000164

2. Structural Transformation of Dislocated Micropipes in Silicon Carbide

   M. Yu. Gutkin, A. G. Sheĭnerman, T. S. Argunova +4

   СтатьяAdvanced Surface Polishing TechniquesMaterials science forum2004Цитирований: 0

   ABIABI:AkademIndex/openalex/2004.article.000208