Characterization of CdTe and CdS Films for Photoresistors
T.M. RazykovPhysical-Technical Insitute of SPA Physics-Sun, Uzbekistan Academy of Sciences, 100084, Tashkent, UzbekistanA. BosioUniversity of Parma, 43121, Parma, ItalyN. RomeoUniversity of Parma, 43121, Parma, ItalyB. A. ErgashevPhysical-Technical Insitute of SPA Physics-Sun, Uzbekistan Academy of Sciences, 100084, Tashkent, UzbekistanAbdurashid MavlonovPhysical-Technical Insitute of SPA Physics-Sun, Uzbekistan Academy of Sciences, 100084, Tashkent, UzbekistanA. Yu. UsmonovPhysical-Technical Insitute of SPA Physics-Sun, Uzbekistan Academy of Sciences, 100084, Tashkent, UzbekistanShaxboz A. EsanovPhysical-Technical Insitute of SPA Physics-Sun, Uzbekistan Academy of Sciences, 100084, Tashkent, Uzbekistan
ABI
Аннотация
Dependences of the evaporation temperature and the growth rate on minimal condensation temperature of polycrystalline CdS films in chemical molecular-beam deposition are discussed. The effect of the evaporation rate and the substrate temperature on the morphology of films has been studied.
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Показатели — AkademScholar · Скоро