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Работ: 7
Работа: Effect of Ar+-ion bombardment on the composition and structure of the surface of CoSi2/Si(111) nanofilms
Structure and electronic properties of nanoscale phases and nanofilms of metal silicides produced by ion implantation in combination with annealing
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СтатьяSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2014Цитирований: 14ABIEstimation of changes in parameters of a crystal lattice and energy bands upon variation in the size of nanocrystals and nanofilms of silicides prepared by ion implantation
Б. Е. Умирзаков, Д. А. Ташмухамедова, Kh. Kh. Kurbanov
СтатьяSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2011Цитирований: 12ABIPhotoelectron Si 2p spectra of ultrathin CoSi2 layers formed on Si(100)2×1
M. V. Gomoyunova, I. I. Pronin, N. R. Gall +2
Статья2003Цитирований: 9ABI