Работы, цитирующие эту работу

Работ: 3

Работа: Electronic structure of silicon dioxide (a review)

1. Investigation of Coatings Formed by Thermal Oxidation on Monocrystalline Silicon

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   СтатьяSurface Roughness and Optical MeasurementsIntegrated ferroelectrics2024Цитирований: 12

   ABIABI:AkademIndex/openalex/2024.article.000603

2. ZrO2 magnetron growth method and investigation of thin film growth

   Б.Д. Игамов, A.I. Kamardin, Y. S. Ergashov +1

   СтатьяSemiconductor materials and devicesAIP conference proceedings2024Цитирований: 1

   ABIABI:AkademIndex/openalex/2024.article.004199

3. Change in characteristics of the band structure of oxide materials at high temperatures

   I. G. Atabaev, M. S. Paizullakhanov, Sh. R. Nurmatov

   СтатьяSemiconductor materials and devicesHigh Temperature2016Цитирований: 0

   ABIABI:AkademIndex/openalex/2016.article.000689