Работы, цитирующие эту работу

Работ: 2

1. Study of the physical nature of Mn4Si7 crystals formed by the diffusion method using an X-ray diffraction

   Б.Д. Игамов, A.I. Kamardin, D.Kh. Nabiev +5

   СтатьяX-ray Diffraction in CrystallographyJournal of Crystal Growth2024Цитирований: 8

   ABIABI:AkademIndex/openalex/2024.article.000891

2. Study of the electrophysical properties of higher manganese silicide (Mn4Si7) thin films and their temperature dependence

   I. R. Bekpulatov, Gunel Imanova, D.Kh. Nabiev +4

   СтатьяSemiconductor materials and interfacesCeramics International2025Цитирований: 5

   ABIABI:AkademIndex/openalex/2025.article.000626