Работы, цитирующие эту работу

Работ: 3

Работа: Size–strain study of NiO nanoparticles by X-ray powder diffraction line broadening

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   СтатьяSemiconductor materials and interfacesJournal of Materials Science Materials in Engineering2025Цитирований: 4

   ABIABI:AkademIndex/openalex/2025.article.000878

2. Аnаlysis оf Na-А zeоlite bаsed оn kаоlin using аn X-rаy diffrаctоmeter

   Muxlis Оydinоv, Bakhrom Igаmоv, I. R. Bekpulatov +2

   СтатьяElectric Power Systems and ControlChemical Bulletin of Kazakh National University2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.267085

3. Study of the temperature dependence of the electrophysical and crystal structure of a thin coating of manganese silicide

   B.D. Igamov, A.I. Kamardin, I.R. Bekpulatov +1

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   ABIABI:AkademIndex/openalex/2026.article.000612