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Работы, на которые ссылается эта работа

Работ: 7

Работа: Modification of the Surface Properties of Free Si–Cu Films by Implantation of Active Metal Ions

  1. Analysis of the structure and properties of heterostructured nanofilms prepared by epitaxy and ion implantation methods

    Б. Е. Умирзаков, Д. А. Ташмухамедова, М. К. Рузибаева +3

    СтатьяMetal and Thin Film MechanicsTechnical Physics2013Цитирований: 15
    ABI

  2. Applying low-energy ion implantation in the creation of nanocontacts on the surface of ultrathin semiconductor films

    D. M. Muradkabilov, Д. А. Ташмухамедова, Б. Е. Умирзаков

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2013Цитирований: 14
    ABI

  3. Analysis of profiles of atomic distribution over the depth of Si-Me free nanofilm systems

    Б. Е. Умирзаков, З. А. Исаханов, М. К. Рузибаева +2

    СтатьяSemiconductor materials and interfacesTechnical Physics2015Цитирований: 5
    ABI

  4. Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures

    З. А. Исаханов, Tulkin Kodirov, A. S. Halmatov +3

    СтатьяMetal and Thin Film MechanicsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2017Цитирований: 3
    ABI

  5. Preparation of Step-free Single Crystal Metal Films with Desired Surface Orientations by Means of Vacuum Evaporation

    Kenji Wakashima, Masatoshi Fukamachi, Sigemaro Nagakura

    Статья1969Цитирований: 2
    ABI

  6. On the origin of the 1.5 μm luminescence in ion beam synthesized β-FeSi2

    D. Leong, M. Harry, K.J. Reeson +1

    Статья1996Цитирований: 2
    ABI

  7. A study of the orientation dependence of the electron energy loss spectra for single crystal films of copper and silver

    А. А. Алиев, З. А. Исаханов, М. К. Рузибаева

    СтатьяElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2012Цитирований: 1
    ABI