Работы, цитирующие эту работу

Работ: 2

Работа: Microstructural studies on variation of defect parameters in Zr-Sn alloys and their transition with interchange of solvent and solute in Zr-Ti and Ti-Zr alloy systems by modified Rietveld method and Warren-Averbach method

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   СтатьяSemiconductor materials and interfacesEast European Journal of Physics2023Цитирований: 8

   ABIABI:AkademIndex/openalex/2026.other.258448

2. Optical Properties of GexSi1 – x Binary Compounds in Silicon

   Н. Ф. Зикриллаев, Habibjon Kushiev, Shahzodbek I. Hamrokulov +1

   СтатьяSemiconductor materials and interfacesJournal of Nano- and Electronic Physics2023Цитирований: 5

   ABIABI:AkademIndex/openalex/2023.article.002005