Работы, цитирующие эту работу

Работ: 2

Работа: Comparison of Infrared and Activation Analysis Results in Determining the Oxygen and Carbon Content in Silicon

1. Thermally Induced Deep Centers in Silicon Doped with Europium or Lanthanum

   Kh.S. Daliev, Sharifa B. Utamuradova, I. Kh. Khamidzhonov +3

   СтатьяSilicon Nanostructures and PhotoluminescenceInorganic Materials2001Цитирований: 8

   ABIABI:AkademIndex/openalex/2026.other.257956

2. Capacitive Spectroscopy of Deep Levels in Silicon with Samarium Impurity

   Sharifa B. Utamuradova, Khojakbar S. Daliev, Shakhrukh Kh. Daliev +1

   СтатьяSilicon and Solar Cell TechnologiesEast European Journal of Physics2023Цитирований: 2

   ABIABI:AkademIndex/openalex/2023.article.002748