Работы, цитирующие эту работу

Работ: 2

Работа: Energy distribution of metal and noble gas ions traversing single-crystal copper films

1. Analysis of profiles of atomic distribution over the depth of Si-Me free nanofilm systems

   Б. Е. Умирзаков, З. А. Исаханов, М. К. Рузибаева +2

   СтатьяSemiconductor materials and interfacesTechnical Physics2015Цитирований: 5

   ABIABI:AkademIndex/openalex/2026.other.495098

2. Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures

   З. А. Исаханов, Tulkin Kodirov, A. S. Halmatov +3

   СтатьяMetal and Thin Film MechanicsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2017Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.495101