Работы, цитирующие эту работу

Работ: 2

Работа: Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

1. Sensitivity of dislocation engineered Si p-n junctions to influence of illumination and ultrasound

   A.Sh. Davletova, Smagul Karazhanov

   СтатьяSemiconductor materials and interfacesInorganic Materials2009Цитирований: 0

   ABIABI:AkademIndex/openalex/2009.article.000359

2. Без названия

   M. Sh. Abdullayev, Mirabbos Yo, Zilola Madaminova +56

   ДругоеUniversum Technical sciences2022Цитирований: 0

   ABIABI:AkademIndex/openalex/2022.other.001134