Ушбу иш иқтибос қилган ишлар

10 та иш

Иш: Influence of X-irradiation on silicon Schottky diodes

1. Statistics of the Recombinations of Holes and Electrons

   W. Shockley, W. T. Read

   Мақола195219 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.357503

2. Reactor irradiation enhanced hetero-diffusion in silicon

   A. I. Koifman, O. R. Niyazova

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (a)19723 иқтибос

   ABIABI:AkademIndex/openalex/1972.article.000005

3. Determination of deep trap levels in silicon using ion-implantation and CV-measurements

   Michael Schulz

   Мақола19742 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.561351

4. Diffusion in Semiconductors

   J. C. Pfister

   Боб19832 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.602723

5. Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

   Chih‐Tang Sah, W. Shockley

   Мақола19582 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.605011

6. Frequency dependence of the reverse-biased capacitance of gold-doped silicon P⁺N step junctions

   C. T. Sah, V.G.K. Reddi

   Мақола19642 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.653539

7. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.653540

8. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.653541

9. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.653542

10. Сарлавҳасиз

    Бошқа1 иқтибос

    ABIABI:AkademIndex/openalex/2026.other.653543