Ушбу иш иқтибос қилган ишлар

2 та иш

Иш: Study of the iron distribution profile and the influence of annealing on the structure implanted in silicon

1. Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni

   Mark C. Biesinger, Brad P. Payne, Andrew P. Grosvenor +3

   Мақола20109 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.026454

2. Effect of annealing on the crystal structure of the surface of silicon doped with Ni, Fe, and Co ions

   Б. Э. Эгамбердиев, N. T. Rustamov, A. S. Mallaev +1

   МақолаSilicon and Solar Cell TechnologiesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20156 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.144418