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Иш: STUDYING THE INFLUENCE OF PROTON IRRADIATION ON THE DISTRIBUTION PROFILE OF Pt AND Cr IN SURFACE LAYERS n-Si˂Pt˃, n-Si˂Сr˃ USING ELLIPSOMETRIC SPECTROSCOPY
Raman spectroscopy of PtSi formation at the Pt/Si(100) interface
J. C. Tsang, Y. Yokota, R. Matz +1
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