Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Microstructural studies on variation of defect parameters in Zr-Sn alloys and their transition with interchange of solvent and solute in Zr-Ti and Ti-Zr alloy systems by modified Rietveld method and Warren-Averbach method

1. Current Status of Silicon Studies with GexSi1-x Binary Compounds and Possibilities of Their Applications in Electronics

   Н. Ф. Зикриллаев, G. A. Kushiev, Sergey V. Koveshnikov +3

   МақолаSemiconductor materials and interfacesEast European Journal of Physics20238 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.258448

2. Optical Properties of GexSi1 – x Binary Compounds in Silicon

   Н. Ф. Зикриллаев, Habibjon Kushiev, Shahzodbek I. Hamrokulov +1

   МақолаSemiconductor materials and interfacesJournal of Nano- and Electronic Physics20235 иқтибос

   ABIABI:AkademIndex/openalex/2023.article.002005