Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Determination of deep trap levels in silicon using ion-implantation and CV-measurements

1. Study of Silicide Formation in Large Diameter Monocrystalline Silicon

   A. T. Mamadalimov, Makhmudkhodja Sh. Isaev, Mukhammadsodik N. Mamatkulov +2

   МақолаSilicon and Solar Cell TechnologiesEast European Journal of Physics20242 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.303746

2. Influence of X-irradiation on silicon Schottky diodes

   U.A. Shakirov, Marat S. Yunusov

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (a)19760 иқтибос

   ABIABI:AkademIndex/openalex/1976.article.000036