Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy

1. Detection of a charge built in the oxide layer of a metal-oxide-semiconductor field-effect transistor by lateral C-V measurement

   A. É. Atamuratov, D. U. Matrasulov, P. K. Khabibullaev

   МақолаSemiconductor materials and devicesDoklady Physics20074 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.536303

2. Characterising lateral capacitance of MNOSFET with localised trapped charge in nitride layer

   A. É. Atamuratov, Zamira Atamuratova, А. Yusupov +1

   МақолаSemiconductor materials and devicesResults in Physics20183 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.570280

3. Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer

   Zamira Atamuratova, А. Yusupov, B. O. Khalikberdiev +1

   МақолаSemiconductor materials and devicesTechnical Physics20193 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.570281

4. Influence of the field of the built-in oxide charge on the lateral C- V dependence of the MOSFET

   A. É. Atamuratov, D. U. Matrasulov, P. K. Khabibullaev

   МақолаSemiconductor materials and devicesDoklady Physics20102 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.612723

5. Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs

   Zamira Atamuratova, Ahmed Yusupov, Jean Chamberlain Chedjou +1

   МақолаSemiconductor materials and devicese-Journal of Surface Science and Nanotechnology20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.006400