Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Frequency dependence of the reverse-biased capacitance of gold-doped silicon P⁺N step junctions

1. Influence of X-irradiation on silicon Schottky diodes

   U.A. Shakirov, Marat S. Yunusov

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (a)19760 иқтибос

   ABIABI:AkademIndex/openalex/1976.article.000036

2. Behavior of epitaxial GaAs layers as α particle detectors

   V. M. Botnaryuk, Yu. V. Zhilyaev, А. М. Иванов +2

   МақолаAdvanced Semiconductor Detectors and MaterialsTechnical Physics Letters19980 иқтибос

   ABIABI:AkademIndex/openalex/1998.article.000192