Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Depletion widths of the metal-insulator semiconductor (MIS) structure

1. Transient Processes of Current Reversal in MIS Structures with Majority and Minority Charge Carriers

   S. A. Asimov, D. A. Aronov, D. K. Isamukhamedova +1

   МақолаSemiconductor materials and interfacesphysica status solidi (a)19821 иқтибос

   ABIABI:AkademIndex/openalex/1982.article.000074

2. The influence of inversion layer on the characteristics of the contact-adjoining layer in solar-cell silicon Schottky MTIS structures

   D. A. Aronov, D. K. Isamukhamedova, Yu. M. Yuabov

   МақолаSemiconductor materials and interfacesphysica status solidi (a)19860 иқтибос

   ABIABI:AkademIndex/openalex/1986.article.000099