Paul Stradins

3 ta ish

Fizika-Texnika Instituti

1. Light-Induced Degradation Effects in a-Si:H Observed by Raman Scattering Measurements

   Paul Stradins, Michio Kondo, Nobuhiro Hata +1

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings19980 iqtibos

   ABIABI:AkademIndex/1998.article.000157

2. A Study of the Time Scales of Processes Responsible for the Light-induced Degradation of a-Si:H by Pulse Illumination

   Paul Stradins, Michio Kondo, Akihisa Matsuda

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings20000 iqtibos

   ABIABI:AkademIndex/2000.article.000161

3. On the Role of Charged Defect States and Deep Traps in the Photocarrier Drift and Diffusion in a-Si:H

   Paul Stradins, Akihisa Matsuda

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings20000 iqtibos

   ABIABI:AkademIndex/2000.article.000287