E. I. Shek

2 ta ish

Russian Academy of Sciences

1. Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er

   Н. А. Соболев, A. M. Emel’yanov, Yu. A. Kudryavtsev +8

   MaqolaSilicon and Solar Cell TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19970 iqtibos

   ABIABI:AkademIndex/openalex/1997.article.000191

2. Influence of Extended Structural Defects on the Characteristics of Electroluminescence in Efficient Silicon Light-Emitting Diodes

   Н. А. Соболев, A. M. Emel’yanov, E. I. Shek +1

   MaqolaSilicon Nanostructures and PhotoluminescenceDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena20030 iqtibos

   ABIABI:AkademIndex/openalex/2003.article.000127