А. И. Ковалев

1 ta ish

Central Institute of Ferrous Metallurgy, Moscow, 107005, Russia

1. High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities

   O. K. Kuvandikov, E.U. Arzikulov, А. И. Ковалев +1

   MaqolaSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics20070 iqtibos

   ABIABI:AkademIndex/openalex/2007.article.000343