E.U. Arzikulov
25 ta ish
Samarkand State University, Boulevard Universitetski, Samarkand, 140104, Republic of Uzbekistan
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
O. K. Kuvandikov, E.U. Arzikulov, А. И. Ковалев +1
MaqolaSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics20070 iqtibosABINumerical prediction of the tensile strength of composite T-joints considering multiple failure criteria and damage degradation models
Xiaoqiang Wang, Rui Zhang, Chengkun Ma +7
MaqolaStructural Analysis and OptimizationInternational Journal of Computational Materials Science and Engineering20250 iqtibosABI