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Ish: The The Gas-Sensitive Properties of Tin Dioxide Films
Research of the Impact of Silicon Doping with Holmium on its Structure and Properties Using Raman Scattering Spectroscopy Methods
Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, Alisher Khaitbaev +3
MaqolaOchiq kirishSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics20248 iqtibosABI