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Ish: STUDYING THE INFLUENCE OF PROTON IRRADIATION ON THE DISTRIBUTION PROFILE OF Pt AND Cr IN SURFACE LAYERS n-Si˂Pt˃, n-Si˂Сr˃ USING ELLIPSOMETRIC SPECTROSCOPY

  1. Raman spectroscopy of PtSi formation at the Pt/Si(100) interface

    J. C. Tsang, Y. Yokota, R. Matz +1

    Maqola19846 iqtibos
    ABI