Asosiy kontentga oʻtish
AkademIndex

Xizmatlar

← Ishga qaytish

Ushbu ish iqtibos qilgan ishlar

18 ta ish

Ish: Reflection z‐scan measurements of opaque semiconductor thin films

  1. Sarlavhasiz

    Boshqa1 274 iqtibos
    ABI

  2. Sensitive measurement of optical nonlinearities using a single beam

    Mansoor Sheik‐Bahae, A. A. Said, Tai‐Huei Wei +2

    MaqolaOchiq kirish1990110 iqtibos
    ABI

  3. Theoretical study on the closed-aperture Z-scan curves in the materials with nonlinear refraction and strong nonlinear absorption

    Xiaodong Li, Shengli Guo, Hui‐Tian Wang +1

    Maqola200132 iqtibos
    ABI

  4. Investigation of nonlinear refraction and nonlinear absorption of semiconductor nanoparticle solutions prepared by laser ablation

    R. A. Ganeev, A.I. Ryasnyansky, R. I. Tugushev +1

    MaqolaOchiq kirish200317 iqtibos
    ABI

  5. Dispersion of bound electron nonlinear refraction in solids

    Mansoor Sheik‐Bahae, D. C. Hutchings, David J. Hagan +1

    MaqolaOchiq kirish199114 iqtibos
    ABI

  6. Optical nonlinearities and photo-excited carrier lifetime in CdS at 532 nm

    H.P Li, C. H. Kam, Yee Loy Lam +1

    Maqola200113 iqtibos
    ABI

  7. Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

    T. Xia, David J. Hagan, Mansoor Sheik‐Bahae +1

    MaqolaOchiq kirish199411 iqtibos
    ABI

  8. Nonlinear refraction in CS2

    R. A. Ganeev, A.I. Ryasnyansky, M. Baba +5

    MaqolaNonlinear Optical Materials StudiesApplied Physics B20049 iqtibos
    ABI

  9. Measurement of nonlinear refractive index by time-resolved z-scan technique

    Tadashi Kawazoe, Hitoshi Kawaguchi, Jun Inoue +2

    Maqola19999 iqtibos
    ABI

  10. Reflection <i>Z</i>-scan technique for measurements of optical properties of surfaces

    Д. В. Петров, Alex Sandro Gomes, Cid B. de Araújo

    Maqola19949 iqtibos
    ABI

  11. Measurement of refractive nonlinearities in GaAs above bandgap energy

    Marcelo Martinelli, Laércio Gomes, R. J. Horowicz

    MaqolaOchiq kirish20008 iqtibos
    ABI

  12. Measurements of nondegenerate optical nonlinearity using a two-color single beam method

    H. Ma, Anderson S. L. Gomes, Cid B. de Araújo

    Maqola19918 iqtibos
    ABI

  13. Variations of nonlinear optical characteristics of C60 thin films at 532 nm

    R. A. Ganeev, A.I. Ryasnyansky, В. И. Редкоречев +3

    MaqolaNonlinear Optical Materials StudiesOptics Communications20036 iqtibos
    ABI

  14. Measurement of refractive-index change at a liquid–solid interface close to the critical angle

    M. Martinelli, Marcos Gugliotti, R. J. Horowicz

    Maqola20005 iqtibos
    ABI

  15. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

    M. Martinelli, S. Bian, J. R. Leite +1

    Maqola19985 iqtibos
    ABI

  16. Reflection of a Gaussian beam from a saturable absorber

    Д. В. Петров, Anderson S. L. Gomes, Cid B. de Araújo

    Maqola19963 iqtibos
    ABI

  17. Optical properties of amorphous multilayers

    H. Hamanaka, Satoshi Konagai, K. Murayama +2

    Maqola19963 iqtibos
    ABI

  18. Sarlavhasiz

    Boshqa2 iqtibos
    ABI