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Ish: Procedure for determining defects in sputtered clusters of ionic crystals
Kinetics of aggregations of F 2, F 3, X, and colloid centers in LiF/Si(111) films upon low-temperature annealing
Utkirjon Sharopov, Б.Г. Атабаев, R. Djabberganov +1
MaqolaElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques201311 iqtibosABIElectron stimulated desorption of neutral species from (100) KCl surfaces
Marek Szymoński, A. Poradzisz, P. Czuba +5
Maqola19923 iqtibosABIPotential Sputtering of Lithium Fluoride by Slow Multicharged Ions
T. Neidhart, Franz Pichler, F. Aumayr +3
Maqola19952 iqtibosABIPositive-ion production by electron bombardment of alkali halides
R. E. Walkup, Phaedon Avouris, Aryya Ghosh
Maqola19872 iqtibosABIDefect mediated sputtering of amorphous LiF induced by low-energy ion bombardment
N. Seifert, Qun Yan, A. V. Barnes +5
Maqola19952 iqtibosABIThreshold for Potential Sputtering of LiF
G. Hayderer, Michael Schmid, П. Варга +7
Maqola19992 iqtibosABI