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Ish: The Morphology and Electronic Properties of Si Nanoscale Structures on a CaF2 Surface
Applying low-energy ion implantation in the creation of nanocontacts on the surface of ultrathin semiconductor films
D. M. Muradkabilov, Д. А. Ташмухамедова, Б. Е. Умирзаков
MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques201314 iqtibosABIKinetics of aggregations of F 2, F 3, X, and colloid centers in LiF/Si(111) films upon low-temperature annealing
Utkirjon Sharopov, Б.Г. Атабаев, R. Djabberganov +1
MaqolaElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques201311 iqtibosABIPhotoelectron Si 2p spectra of ultrathin CoSi2 layers formed on Si(100)2×1
M. V. Gomoyunova, I. I. Pronin, N. R. Gall +2
Maqola20039 iqtibosABI