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5 ta ish

Ish: Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 iqtibos
    ABI

  2. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 iqtibos
    ABI

  3. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 iqtibos
    ABI

  4. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 iqtibos
    ABI

  5. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisTechnical Physics20130 iqtibos
    ABI