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Ish: Crystal structure of the films of highest manganese silicide on silicon

1. Electron microscopy characterization of higher manganese silicide film structure on silicon

   Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

   MaqolaSemiconductor materials and interfacesNanotechnologies in Russia20167 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.079735

2. Structure of thermoelectric films of higher manganese silicide on silicon according to electron microscopy data

   Andrey Orekhov, T. S. Kamilov, B.V. Ibragimova +2

   MaqolaSemiconductor materials and interfacesSemiconductors20175 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.199258

3. About the Interface Between the Higher Manganese Silicide Film and Si (111)

   T. S. Kamilov, D.K. Kabilov, S.Kh. Babadjanov +5

   MaqolaSemiconductor materials and interfaces20060 iqtibos

   ABIABI:AkademIndex/openalex/2006.article.000312