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Electron and X-Ray Spectroscopy Techniques

226 works

  1. Applications of Ion Beam Methods in Silicide/Si and Silicide/GaAs Nanometre Structures

    Yanwen Zhang

    DissertationIon-surface interactions and analysisLund University Publications (Lund University)19980 citations
    ABI

  2. Hydrogenation and annealing effects on the trapping times of the minority carriers in In-doped CdTe epitaxial layers grown on p-CdTe (211) substrates

    Sh. U. Yuldashev, Igor L. Bolotin, Y. B. Hou +4

    ArticleAdvanced Semiconductor Detectors and MaterialsJournal of Applied Physics19990 citations
    ABI

  3. Focusing of a Compensated Nonuniform Electron Beam

    S. V. Adamenko, В. В. Долгополов, Yu. V. Kirichenko +1

    ArticleAdvanced Electron Microscopy Techniques and ApplicationsTelecommunications and Radio Engineering19990 citations
    ABI

  4. Computer simulation of above-surface neutralization of highly charged ions approaching a metal surface

    M.N. Mirakhmedov, R.A. Salimova

    ArticleElectron and X-Ray Spectroscopy TechniquesNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19990 citations
    ABI

  5. Investigation of some impurity profiles by (n,α) reactions

    M. Kadirova, Yu. F. Simakhin, N. Jumaev +1

    ArticleNuclear physics research studiesBiological Trace Element Research19990 citations
    ABI

  6. Experimental and theoretical investigations of the charge and excitation states formation processes of low energy atomic and molecular particles outgoing the solid surface. Progress report for 1995/11/15-1998/11/14

    У. Х. Расулев

    ArticleElectron and X-Ray Spectroscopy Techniques19990 citations
    ABI

  7. Low energy electron and photoelectron spectroscopy of Si(111) surface implanted by P + and B + ions

    А.С. Рысбаев, A. K. Tashatov

    ArticleElectron and X-Ray Spectroscopy Techniques19990 citations
    ABI

  8. Investigation of an ion source intended for beam technologies

    L. P. Veresov, O. L. Veresov, P. A. Litvinov

    ArticleIon-surface interactions and analysisTechnical Physics20000 citations
    ABI

  9. The comparative investigation of spectra of characteristic energy losses of electrons reflected from the surface of semiconductors and their alloys

    А. А. Алиев, М. К. Рузибаева, Artem Kim

    ArticleElectron and X-Ray Spectroscopy TechniquesVacuum20000 citations
    ABI

  10. Role of Nondipole Transitions in Formation of K-Edge Extended Electron Energy Loss Fine Structure

    D. E. Gai, В. И. Гребенников, Yu. V. Ratz

    ArticleElectron and X-Ray Spectroscopy TechniquesJournal of Structural Chemistry20000 citations
    ABI

  11. CALIBRATION OF X-RAY DIODE PHOTOCATHODES

    Huang Tian-xua

    ArticleElectron and X-Ray Spectroscopy TechniquesHigh Power Laser and Particle Beams20000 citations
    ABI

  12. X-ray determination of gold contents in ion-exchange pitch

    R.T. Khajdarov, Yu. S. Karimov, V. I. Petrenko +3

    ArticleElectron and X-Ray Spectroscopy Techniques20000 citations
    ABI

  13. Low and High Energy Ion Beams in Nanotechnology

    Thomas Winzell

    DissertationIon-surface interactions and analysisLund University Publications (Lund University)20000 citations
    ABI

  14. Production of carrier-free germanium-68 by alpha-particle bombardment zinc cyclotron target

    S. Kh. Egamediev

    ArticleNuclear Physics and ApplicationsAIP conference proceedings20010 citations
    ABI

  15. Strong correlation effects in atomic photoelectron angular distributions far above thresholds

    V. K. Dolmatov, A. S. Baltenkov, Steven T. Manson

    ArticleElectron and X-Ray Spectroscopy TechniquesPhysical Review A20010 citations
    ABI

  16. An Empirical Formula of Atomic K-Shell Ionization Cross Sections by Electron Impact

    Tang Changhuan, An Zhu, Fan Xiao-Qiang +1

    ArticleX-ray Spectroscopy and Fluorescence AnalysisChinese Physics Letters20010 citations
    ABI

  17. Measurement of the internal conversion electron lines by the track counting technique

    T.A. Islamov, V. G. Kalinnikov, N. T. Kambarova +6

    ArticleElectron and X-Ray Spectroscopy TechniquesTechnical Physics Letters20010 citations
    ABI

  18. Investigation of internal conversion electron lines by track counting technique

    T.A. Islamov, V. G. Kalinnikov, N. T. Kambarova +6

    ArticleElectron and X-Ray Spectroscopy TechniquesPis'ma v Zhurnal Tekhnicheskoj Fiziki20010 citations
    ABI

  19. Defects in Aluminum Coatings on Silicate Glass

    Ф. З. Гильмутдинов, О. М. Канунникова, V. I. Kozhevnikov

    ArticleElectron and X-Ray Spectroscopy TechniquesGlass and Ceramics20010 citations
    ABI

  20. M Spectra of Elements 39 ≤ Z ≤ 56 Measured with an Ultra-Thin Window Si(Li) Detector

    Michael Wendt

    ArticleElectron and X-Ray Spectroscopy TechniquesMicrochimica Acta20020 citations
    ABI

  21. Influence of ion implantation and annealing on composition and structure of GaAs surface

    M.T. Normuradov

    ArticleIon-surface interactions and analysisSemiconductor Physics Quantum Electronics & Optoelectronics20020 citations
    ABI

  22. Structural, Physicomechanical, and Sorption Properties of Ternary Acrylonitrile Copolymer Fibres

    M. Yu. Mukhamedzhanova, Natasha Shirshova, Г. В. Никонович +4

    ArticleFiber-reinforced polymer compositesFibre Chemistry20030 citations
    ABI

  23. New complex basis functions for variational calculation coulomb systems

    O. N. Yusupov

    ArticleAtomic and Molecular Physics20040 citations
    ABI

  24. Measurement of the Background Level in the Spectra of Internal-Conversion Electrons Using the МАС-1 Microscope Complex

    D. D. Bogachenko, I. V. Gaidaenko, O. K. Egorov +5

    ArticleElectron and X-Ray Spectroscopy TechniquesInstruments and Experimental Techniques20040 citations
    ABI

  25. Photoelectric properties of silver levels in silicon

    N.A. Sultanov

    ArticleSurface and Thin Film Phenomena20040 citations
    ABI