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Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M photodiodes

Д. М. ШукуроваBeruni State Technical University, Universitetskaya ul. 2, Tashkent, 700095, UzbekistanAndrey OrekhovShubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, RussiaB. Z. SharipovBeruni State Technical University, Universitetskaya ul. 2, Tashkent, 700095, UzbekistanV. V. KlechkovskayaShubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, RussiaT. S. KamilovBeruni State Technical University, Universitetskaya ul. 2, Tashkent, 700095, Uzbekistan
Technical Physicsjournal2011en
ABI

Abstract

The current-voltage characteristics of Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M photodiodes are studied experimentally. The current passage mechanism under illumination with hν ≥ E g is considered. The role of a contact to Mn4Si7 in the provision of high photosensitivity under illumination of the base by light with hν ≥ 1.14 eV at low temperatures, 77–220 K, is analyzed. From electrical measurements, electron microscopic data for the Mn4Si7-Si〈Mn〉 interface, and photocurrent-voltage characteristics, a band diagram under the conditions of photocurrent passage is constructed. The high low-temperature photosensitivity of the diodes (I ph/I d ≥ 109) is explained by the impact-ionization-induced modulation of the base conductivity and injection amplification of holes in the transition layer.

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